MIT develops AI tool for faster material testing
SpectroGen can simulate X-ray or Raman scans using only infrared data, cutting testing times dramatically.
MIT engineers have created an AI system that can assess material quality faster and more cheaply by generating synthetic spectral data. The tool uses generative AI to produce spectral readings across different scanning modalities, allowing industries to verify materials without using multiple instruments.
By analysing one type of scan, such as infrared, SpectroGen can accurately recreate what the same material’s X-ray or Raman spectrum would look like. The process is completed in less than a minute with AI, compared with hours or days using traditional laboratory equipment.
Researchers said the system achieved a 99% match with real-world data in trials involving more than 6,000 mineral samples. The breakthrough could streamline quality control in manufacturing, pharmaceuticals, semiconductors, and battery production, cutting both time and cost.
Professor Loza Tadesse described SpectroGen as a ‘co-pilot’ for researchers and technicians. Her team is now exploring medical and agricultural applications in the US, supported by Google funding, and plans to commercialise the technology through a startup.
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